The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
Feb. 27, 2014
Teknologian Tutkimuskeskus Vtt Oy, Espoo, FI;
Kirsi Tappura, Tampere, FI;
Hannu Välimäki, Tampere, FI;
Teknologian tutkimuskeskus VTT Oy, Espoo, FI;
Abstract
A sample plate () and an analyzing method, wherein the sample plate () comprises a substrate (), at least one sensor site () on a first surface () of the substrate () and at least one optical element () on a second surface () of the substrate (). The sample plate () is further provided with a waveguide () on the second surface () for guiding an excitation signal to interact with the at least one sensor site (). The method comprises bringing the sample in contact with at least one sensor site (), exciting the sensor site () in order to obtain an emitted signal, and selectively collecting the emitted signal by means of at least one optical element () and utilizing a supercritical angle fluorescence method; and detecting the collected emitted signals by a detector. In the method, the sensor site () is excited by means of an evanescent field generated by the excitation signal propagating in a waveguide ().