The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2018

Filed:

Apr. 30, 2015
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventor:

Tomoaki Chono, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 8/08 (2006.01); A61B 8/02 (2006.01); G06T 7/00 (2017.01); G06T 7/60 (2017.01);
U.S. Cl.
CPC ...
A61B 8/5207 (2013.01); A61B 8/02 (2013.01); A61B 8/486 (2013.01); G06T 7/0012 (2013.01); G06T 7/60 (2013.01); G06T 2207/10132 (2013.01);
Abstract

An extraction period specification unit specifies an extraction period (extraction section) for an M-mode image. A model expansion/contraction unit establishes a contour model (initial configuration) in relation to the specified extraction period while expanding/contracting the contour model in the direction of the time axis so as to conform with the extraction period. A node position change unit performs, for each node forming a plurality of node strings included in the established contour model, an edge (contour) search while successively changing the positions of the nodes, resulting in the formation of a revised contour model comprising a plurality of nodes at an edge detection position. A trace unit carries out interpolation on a plurality of node strings included in the revised contour model, thereby generating a plurality of trace lines simulating a plurality of contour lines.


Find Patent Forward Citations

Loading…