The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
Mar. 30, 2015
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Takuya Sakaguchi, Utsunomiya, JP;
Hisato Takemoto, Amherst, MA (US);
Yuichiro Watanabe, Yaita, JP;
Ryuji Zaiki, Utsunomiya, JP;
Ryoichi Nagae, Nasushiobara, JP;
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Abstract
An X-ray diagnostic apparatus in embodiments includes a calculating module, a generator, and a changing module. The calculating module calculates feature quantity concerning a flow of a contrast material for each pixel in a predetermined section based on temporal transition in signal intensity of the contrast material in a predetermined section of a plurality of X-ray images radiographed with time by using the contrast material. The generator generates a first color image in which color information corresponding to the feature quantity concerning the flow of the contrast material in a first section as the predetermined section is reflected in each pixel. The changing module changes the predetermined section to a second section that is within the first section. the generator generates a second color image in which color information corresponding to the feature quantity concerning the flow of the contrast material in the second section is reflected in each pixel based on the color information corresponding to the second section out of the color information corresponding to the feature quantity concerning the flow of the contrast material in the first section and the feature quantity calculated in the second section.