The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2018

Filed:

Oct. 09, 2015
Applicant:

Kabushiki Kaisha Topcon, Itabashi-ku, JP;

Inventor:

Yoshikiyo Moriguchi, Itabashi-ku, JP;

Assignee:

KABUSHIKI KAISHA TOPCON, Itabashi-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); A61B 3/00 (2006.01); A61B 3/10 (2006.01); A61B 3/12 (2006.01); A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
A61B 3/0025 (2013.01); A61B 3/0083 (2013.01); A61B 3/102 (2013.01); A61B 3/12 (2013.01); A61B 3/14 (2013.01); G01B 9/02083 (2013.01); G01B 9/02091 (2013.01);
Abstract

According to one embodiment, a data processing method is used for processing collected data acquired with respect to each A-line by swept-source OCT using a wavelength sweeping light source having a predetermined wavelength sweeping range. The data processing method detects a reference signal assigned in advance to a clock, the wavenumber of which linearly varies along the time axis, in a predetermined wavelength position within the predetermined wavelength sweeping range. Then, the data processing method sequentially performs sampling of the collected data based on the clock with reference to the predetermined wavelength position where the reference signal detected is assigned. Further, the data processing method forms an image of a corresponding A-line based on the sampled collected data.


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