The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Jan. 11, 2016
Applicant:

Omnivision Technologies, Inc., Santa Clara, CA (US);

Inventor:

Olivier Bulteel, San Jose, CA (US);

Assignee:

OmniVision Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/378 (2011.01);
U.S. Cl.
CPC ...
H04N 5/378 (2013.01);
Abstract

A method of reducing noise in an image sensor using a parallel multi-ramps merged comparator analog-to-digital converter (ADC) starts with a pixel array capturing image data. The pixel array includes pixels to generate pixel data signals, respectively. An ADC circuitry acquires the pixel data signals. The ADC circuitry includes ADC circuits. Each of the ADC circuits includes a comparator and latches. The comparator includes a multi-input first stage. The comparator in each ADC circuit compares one of the pixel data signals to ramp signals received from a logic circuitry to generate comparator output signals. The latches in each ADC circuit latches the counter based on the comparator output signals, respectively, to generate ADC outputs. Other embodiments are described.


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