The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2018
Filed:
Jul. 27, 2016
Tomoaki Suga, Kanagawa, JP;
Satoshi Mohri, Kanagawa, JP;
Hideyo Makino, Tokyo, JP;
Yoshiaki Morita, Kanagawa, JP;
Satoshi Nakayama, Kanagawa, JP;
Takahiro Konishi, Kanagawa, JP;
Tomoaki Suga, Kanagawa, JP;
Satoshi Mohri, Kanagawa, JP;
Hideyo Makino, Tokyo, JP;
Yoshiaki Morita, Kanagawa, JP;
Satoshi Nakayama, Kanagawa, JP;
Takahiro Konishi, Kanagawa, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
An image measurement sheet for measuring an image formed on a recording medium includes a sheet having a plurality of medium scan windows used for detecting the recording medium, a plurality of image scan windows used for detecting the image formed on the recording medium, and an information scan window used for detecting imaging condition information recorded on the recording medium with the image, the plurality of medium scan windows to be corresponded to a portion of sides and a corner of the recording medium, the plurality of image scan windows to be corresponded to a portion of the image formed on the recording medium, and the information scan window to be corresponded to the imaging condition information recorded on the recording medium.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile