The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Dec. 31, 2012
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Thomas J. McSweeney, Hoquiam, WA (US);

Nicholas Weaver, North Richland Hills, TX (US);

John Daniel Hushon, Medfield, MA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); H04L 12/26 (2006.01); H04L 29/08 (2006.01); G06F 12/00 (2006.01);
U.S. Cl.
CPC ...
H04L 43/00 (2013.01); H04L 29/08072 (2013.01);
Abstract

A node is monitored using metadata gathered by an in-memory process. Metadata for the node is dynamically gathered using a process running in memory; and the gathered metadata is provided to a remote server for storage. The process comprises, for example, an in-memory microkernel executing on a boot node. The metadata comprises, for example, information about physical characteristics of the node, information about one or more software packages installed on the node and/or information about one or more of an operating system, a BIOS and firmware. The gathered metadata can be processed to update a finite state machine to indicate a state of the node and/or to detect a change in state of the node.


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