The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2018
Filed:
Jul. 10, 2014
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Youn Sun Kim, Gyeonggi-do, KR;
Ju Ho Lee, Gyeonggi-do, KR;
Hyo Jin Lee, Gyeonggi-do, KR;
Yong Jun Kwak, Gyeonggi-do, KR;
Young Bum Kim, Seoul, KR;
Hyoung Ju Ji, Seoul, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
One or more embodiments discloses a method of measuring interference by an evolved NodeB and an eNB device. The method includes configuring one or more first type interference measurement resources in a User Equipment (UE). The method also includes transmitting signals for a plurality of UEs within a cell range of the eNB to the one or more first type interference measurement resources. The method also includes receiving channel status information generated in accordance with a signal received in the one or more first type interference measurement resources.