The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Dec. 07, 2016
Applicant:

SK Hynix Inc., Icheon-si, Gyeonggi-do, KR;

Inventors:

Mun Seon Jang, Seoul, KR;

Saeng Hwan Kim, Suwon-si, KR;

In Tae Kim, Icheon-si, KR;

Chang Ki Baek, Anyang-si, KR;

Assignee:

SK hynix Inc., Icheon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/42 (2006.01); G11C 29/36 (2006.01); G06F 11/10 (2006.01); G11C 29/52 (2006.01);
U.S. Cl.
CPC ...
G11C 29/42 (2013.01); G06F 11/1068 (2013.01); G11C 29/36 (2013.01); G11C 29/52 (2013.01);
Abstract

A semiconductor device may include a syndrome generation circuit and a failure detection circuit. The syndrome generation circuit may generate a syndrome signal corresponding to a pattern of an output data signal. The failure detection circuit may detect the syndrome signal and sequentially store the syndrome signal to generate a first syndrome signal and a second syndrome signal if an error is detected from the syndrome signal. The failure detection circuit may generate a failure detection signal which is enabled if a logic level combination of the first syndrome signal is different from a logic level combination of the second syndrome signal.


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