The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Feb. 18, 2015
Applicant:

Giesecke & Devrient Gmbh, München, DE;

Inventors:

Johann Kecht, München, DE;

Martin Stark, München, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G07D 7/12 (2016.01); D21H 21/48 (2006.01); B42D 25/382 (2014.01); B42D 25/378 (2014.01); G07D 7/2033 (2016.01); B42D 25/21 (2014.01); B42D 25/29 (2014.01); B42D 25/387 (2014.01); G01N 21/64 (2006.01); G07D 7/1205 (2016.01);
U.S. Cl.
CPC ...
G07D 7/12 (2013.01); B42D 25/21 (2014.10); B42D 25/29 (2014.10); B42D 25/378 (2014.10); B42D 25/382 (2014.10); B42D 25/387 (2014.10); D21H 21/48 (2013.01); G01N 21/6428 (2013.01); G07D 7/1205 (2017.05); G07D 7/2033 (2013.01);
Abstract

The invention relates to a security feature for safeguarding value documents, comprising particles which are composed of at least two different, spatially separate solid homogeneous phases, wherein each of the phases is detectable and identifiable in a spatially resolved manner by means of a spatially resolving analytical method that is adapted for resolving down to the single-particle level.


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