The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2018
Filed:
Oct. 10, 2016
Beamr Imaging Ltd., Tel-Aviv, IL;
Sharon Carmel, Ramat Hasharon, IL;
Dror Gill, Haifa, IL;
Tamar Shoham, Netanya, IL;
Udi Yehuda Shrot, Givat Shmuel, IL;
Boris Filippov, St. Petersburg, RU;
BEAMR IMAGING LTD, Tel Aviv, IL;
Abstract
There is provided a computerized method and system of controlling a quality measure in a compression quality evaluation system, the method comprising: calculating a grain value indicative of an extent of grain present in an input image, the grain value being calculated based on one or more features characterizing a base image related to the input image; and configuring the quality measure upon a criterion being met by the value, the quality measure being indicative of perceptual quality of a compressed image compressed from the input image. The calculated grain value may be dependent also on further characteristics of the input image, or in the case of a sequence of images, dependent also on the relation between the image and the preceding image.