The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2018
Filed:
Oct. 31, 2014
The Research Foundation for the State University of New York, Albany, NY (US);
Fu-pen Chiang, East Setauket, NY (US);
Lingtao Mao, Bejing, CN;
The Research Foundation for the State University of New York, Albany, NY (US);
Abstract
A method of determining interior three-dimensional movement, deformation and strain in an object is provided. The method includes constructing a reference volume image, constructing a deformed volume image, wherein the deformed volume image represents the object after an applied stress and strain. The method further includes comparing the reference volume image and the deformed volume image to determine at least one displacement vector at least one of the x, y, and z directions. In addition it includes making a comparison for size of speckle features measured within the object. Based upon the at least one displacement vector, interior three-dimensional movement, deformation and strain can be measured for the object resulting from the applied stress and strain.