The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Aug. 19, 2016
Applicant:

Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);

Inventors:

Srikumar Ramalingam, Cambridge, MA (US);

Yuichi Taguchi, Cambridge, MA (US);

Bharath Sankaran, Los Angeles, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06T 7/003 (2013.01); G06K 9/46 (2013.01); G06K 2009/4666 (2013.01); G06T 2207/20081 (2013.01);
Abstract

An image registrations includes determining a first binary descriptor of a first key point in a first image, determining a second binary descriptor of a second key point in a second image, determining a weighted Hamming distance between the first binary descriptor and the second binary descriptor, and registering the first key point with the second key point when the weighted Hamming distance is below a noise threshold. At least one element in the first or the second binary descriptor is a result of a comparison of a difference between intensities of at least two pixels of the first or the second image with a threshold. At least two weights of the weighted Hamming distance for comparing at least two elements of the first or the second binary descriptors are different.


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