The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Jan. 22, 2015
Applicant:

Microsoft Technology Licensing, Llc., Redmond, WA (US);

Inventors:

Ishan Misra, Pittsburg, PA (US);

Jin Li, Bellevue, WA (US);

Xian-Sheng Hua, Sammamish, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6227 (2013.01); G06K 9/623 (2013.01); G06K 9/6218 (2013.01); G06K 9/6262 (2013.01);
Abstract

Optimizing multi-class image classification by leveraging patch-based features extracted from weakly supervised images to train classifiers is described. A corpus of images associated with a set of labels may be received. One or more patches may be extracted from individual images in the corpus. Patch-based features may be extracted from the one or more patches and patch representations may be extracted from individual patches of the one or more patches. The patches may be arranged into clusters based at least in part on the patch-based features. At least some of the individual patches may be removed from individual clusters based at least in part on determined similarity values that are representative of similarity between the individual patches. The system may train classifiers based in part on patch-based features extracted from patches in the refined clusters. The classifiers may be used to accurately and efficiently classify new images.


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