The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Mar. 11, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventor:

Mark P. Dennehy, Dublin, IE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30528 (2013.01);
Abstract

In a method for analyzing a data set, one or more processors identifying a data set that includes sequences of data points, identifying a sequence of data points in the identified data set, identifying a window of sequences of data points in the identified data set, wherein the window of sequences of data points is defined based on information including one or more of: a defined number of sequences of data points before and after the identified sequence of data points and a defined reference to a feature of the identified data set, retrieving a set of inflection points in the identified data set that are within the identified window of sequences of data points, and determining: a maximum value, a minimum value, or both a maximum and minimum value, based on the retrieved inflection points that are within the identified window of sequences of data points.


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