The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2018
Filed:
Jun. 27, 2011
Anja Gruenheid, Wiesbaden, DE;
Albert Maier, Tuebingen, DE;
Martin Oberhofer, Bondorf, DE;
Thomas Schwarz, Stuttgart, DE;
Manfred Vodegel, Boeblingen, DE;
Anja Gruenheid, Wiesbaden, DE;
Albert Maier, Tuebingen, DE;
Martin Oberhofer, Bondorf, DE;
Thomas Schwarz, Stuttgart, DE;
Manfred Vodegel, Boeblingen, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
During migration of data from at least one data source to a target system, data quality is determined by obtaining metadata associated with the target system, automatically generating instantiated rules for assessing a quality of data to be loaded from the at least one data source into the target system, where the instantiated rules are dependent upon the obtained metadata associated with the target system, and applying a quality analysis based upon the instantiated rules to the data to be loaded into the target system. The quality analysis provides an indication of a level of compliance of the data with requirements of the target system.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile