The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Aug. 16, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

David Hutton, Tallahassee, FL (US);

Wen Li, Poughkeepsie, NY (US);

Eric Schwarz, Gardiner, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/30 (2018.01); G06F 9/38 (2018.01);
U.S. Cl.
CPC ...
G06F 9/3867 (2013.01); G06F 9/30021 (2013.01); G06F 9/30043 (2013.01); G06F 9/30058 (2013.01); G06F 9/30079 (2013.01); G06F 9/30101 (2013.01); G06F 9/30145 (2013.01); G06F 9/3838 (2013.01);
Abstract

Embodiments relate to register comparison for register comparison for operand store compare (OSC) prediction. An aspect includes, for each instruction in an instruction group of a processor pipeline: determining a base register value of the instruction; determining an index register value of the instruction; and determining a displacement of the instruction. Another aspect includes comparing the base register value, index register value, and displacement of each instruction in the instruction group to the base register value, index register value, and displacement of all other instructions in the instruction group. Another aspect includes based on the comparison, determining that a load instruction of the instruction group has a probable OSC conflict with a store instruction of the instruction group. Yet another aspect includes delaying the load instruction based on the determined probable OSC conflict.


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