The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Jul. 07, 2015
Applicant:

Getac Technology Corporation, Hsinchu County, TW;

Inventors:

Chi-Jung Wu, New Taipei, TW;

Chun-Yu Kuo, Taipei, TW;

Assignee:

Getac Technology Corporation, Hsinchu County, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/20 (2006.01); G05B 19/048 (2006.01);
U.S. Cl.
CPC ...
G06F 1/206 (2013.01); G05B 19/048 (2013.01); G05B 2219/24058 (2013.01); G05B 2219/49219 (2013.01);
Abstract

A testing method adapted for an electronic device operating an operating system at a particular temperature environment is provided. The method includes the steps of: determining whether an operating command is received; when the operating command is received, deriving a test, executing the test, and disabling a fan of the electronic device, wherein the test corresponds to one of a plurality of system states of an operating system, and includes a temperature threshold value corresponding to the system state and an entering action of the system state; and when the system state of the test corresponds to a work mode of the operating system, the test includes: continuously monitoring a temperature value of the central processing unit; and when the temperature value of the central processing unit reaches the temperature threshold value, enabling the fan and executing the entering action of the system state.


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