The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2018
Filed:
Jun. 17, 2015
Boe Technology Group Co., Ltd., Beijing, CN;
Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;
Wenjun Xiao, Beijing, CN;
Xiaochuan Chen, Beijing, CN;
Shijun Wang, Beijing, CN;
Lei Wang, Beijing, CN;
Wenbo Jiang, Beijing, CN;
Yanna Xue, Beijing, CN;
Yue Li, Beijing, CN;
Zhiying Bao, Beijing, CN;
Zhenhua Lv, Beijing, CN;
Yong Zhang, Beijing, CN;
Chunlei Wang, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., Beijing, CN;
Abstract
The present disclosure describes a display Q_panel, a display panel and a manufacturing method thereof, as well as a display apparatus. The display Q_panel comprises a first and a second substrate for cell assembling to pre-form a plurality of display panels. The display Q_panel is provided, between the first substrate and the second substrate, with a blocking wall at the edge region on at least one side thereof, the blocking wall being located externally to the outmost cutting line on that side where it is located, and the sealant on that side being provided internally to the blocking wall. By providing a blocking wall externally to the outmost cutting line on the display Q_panel, the blocking wall blocks the spill-out of the sealant on that side, reduces the undesirable phenomena of sealant puncture, sealant break, etc. arising from the display panels after the cutting, can respond better to the Peel-off, Bending or other tests, and improves the robustness of glass cell assembling.