The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2018
Filed:
Nov. 15, 2013
Applicant:
Thales, Courbevoie, FR;
Inventor:
Mathias Van Den Bossche, Goyrans, FR;
Assignee:
THALES, Courbevoie, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 19/42 (2010.01); G01S 19/20 (2010.01); G01S 19/22 (2010.01); G01S 19/24 (2010.01);
U.S. Cl.
CPC ...
G01S 19/24 (2013.01); G01S 19/20 (2013.01); G01S 19/22 (2013.01);
Abstract
In the field of satellite global navigation, a method is provided for estimating the level of error in global navigation satellite measurements and for ensuring the reliability of these estimations, implemented by a global navigation device in which local errors are detected by said global navigation device and errors associated with the satellites are detected by a ground segment.
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Van Den Bossche, Mathias. (2018). Method for estimating the level of error in satellite geolocation measurements and for monitoring the reliability of said estimations and associated device (U.S. Patent No. 10012737). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10012737
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