The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2018
Filed:
Apr. 27, 2016
Applicant:
Aai Corporation, Hunt Valley, MD (US);
Inventors:
James Joseph Jaklitsch, Parkton, MD (US);
Jay Michael Markey, York, PA (US);
Assignee:
AAI Corporation, Hunt Valley, MD (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/3177 (2006.01); G01R 31/319 (2006.01); G01R 15/12 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31708 (2013.01); G01R 15/12 (2013.01); G01R 31/3177 (2013.01); G01R 31/3191 (2013.01); G01R 31/31703 (2013.01); G01R 31/31901 (2013.01);
Abstract
A technique for testing an electronic UUT by a test apparatus includes obtaining multiple DFTs of a test signal received from the UUT with the test apparatus configured differently for obtaining each DFT. The resulting DFTs include both valid content representing the test signal and invalid content introduced by the test apparatus. The improved technique suppresses the invalid content by generating a corrected DFT, which provides minimum magnitude values for corresponding frequencies relative to the test signal across the multiple DFTs.