The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Sep. 23, 2016
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Minsoo Lim, Hwaseong-si, KR;

Sungjae Lee, Seoul, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/317 (2006.01); G01R 31/3177 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31705 (2013.01); G01R 31/3177 (2013.01); G01R 31/318588 (2013.01); G01R 31/31719 (2013.01);
Abstract

A system on chip (SoC) is provided. The system on chip includes a multiprocessor that includes multiple processors, a debugging controller that includes a debug port and retention logic configured to store an authentication result of a secure joint test action group system, and a power management unit configured to manage power supplied to the multiprocessor and the debugging controller. The power management unit changes the debug port and the retention logic into an alive power domain in response to a debugging request signal.


Find Patent Forward Citations

Lim, Minsoo. (2018). System on chip and secure debugging method (U.S. Patent No. 10012693). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10012693

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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