The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Mar. 25, 2016
Applicant:

Abb Technology Ag, Zurich, CH;

Inventor:

Wolfgang Wimmer, Langenthal, CH;

Assignee:

ABB Schweiz AG, Baden, CH;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 21/133 (2006.01); H04L 12/26 (2006.01); H02H 3/04 (2006.01); H02H 7/26 (2006.01);
U.S. Cl.
CPC ...
G01R 21/133 (2013.01); H02H 3/044 (2013.01); H02H 7/26 (2013.01); H04L 43/50 (2013.01); Y04S 40/168 (2013.01);
Abstract

The invention supports and promotes testing of Substation Automation (SA) functions involving intermediary Logical Nodes (LN) in SA systems of operating substations, specifically with minimized impact on the substation and/or the SA system and without having to completely deactivate or isolate entire parts of the substation. A test is set up by defining at least one input LN where the test scenario input signals will be applied, and by determining output LNs where expected output values shall be observed. Based on the data flow between LNs as defined in the System Configuration Description (SCD) file a test preparing tool automatically determines all intermediary LNs logically arranged between these input and output LNs. The intermediary LNs and the IEDs that are affected by the function test are identified and subsequently marked for 'test' or 'simulation' mode.


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