The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Oct. 16, 2017
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Thomas Lang, Munich, DE;

Nicole Maass, Fuerth, DE;

Frank Dennerlein, Forchheim, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01); G01N 23/046 (2018.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01N 2223/303 (2013.01); G01N 2223/401 (2013.01); G01N 2223/419 (2013.01);
Abstract

A mathematical scattered radiation model with a number of parameters is specified. A test object is scanned with an X-ray system to generate a first raw dataset. The test object is scanned again to generate a second raw dataset, this time with an intermediary X-ray mask having at least one X-ray transparent region and at least one X-ray non-transparent region between the X-ray source and the test object. Parameter values are determined based on the first raw dataset and on the second raw dataset, and the scattered radiation model is calibrated with the parameter values. An examination object is scanned with the X-ray system to generate a third raw dataset and the third raw dataset is processed with the calibrated scattered radiation model to generate a corrected third raw dataset. A set of X-ray image data is generated from the examination object based on the corrected third raw dataset.


Find Patent Forward Citations

Loading…