The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2018
Filed:
Jun. 28, 2012
Alfons Zöller, Bad Soden-Salmunster, DE;
Harro Hagedorn, Frankfurt am Main, DE;
Eckhard Wirth, Gelnhausen, DE;
Werner Weinrich, Langenselbold, DE;
Tobias Gross, Garbsen, DE;
Alfons Zöller, Bad Soden-Salmunster, DE;
Harro Hagedorn, Frankfurt am Main, DE;
Eckhard Wirth, Gelnhausen, DE;
Werner Weinrich, Langenselbold, DE;
Tobias Gross, Garbsen, DE;
LEYBOLD OPTICS GMBH, Alzenau, DE;
Abstract
A test glass changer for optically measuring layer properties in a vacuum coating system including a movable substrate holder for guiding a substrate through a stream of coating material; a mount connected to a rotary spindle and rotatable relative to the substrate holder about the rotary spindle; and a control device directing a test glass element into a ray path of an optical measuring device and into a stream of the coating material. The mount has at least two recesses offset eccentrically with respect to the spindle for one test glass element in each case. The control device can induce a rotational movement of the mount about the spindle. The centering device can exert a torque and holding moment on the mount to bring a test glass element arranged in one of the recesses into a measuring position of the measuring device. Related methods are also provided.