The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Oct. 13, 2016
Applicant:

Manta Instruments, Inc., San Diego, CA (US);

Inventors:

Jan J. Tatarkiewicz, San Diego, CA (US);

Monette Karr, San Diego, CA (US);

Assignee:

Manta Instruments, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01); G01N 15/14 (2006.01); G01N 21/51 (2006.01); G01N 13/00 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1463 (2013.01); G01N 13/00 (2013.01); G01N 15/0205 (2013.01); G01N 21/51 (2013.01); G01N 2015/0038 (2013.01); G01N 2015/0053 (2013.01); G01N 2015/0092 (2013.01); G01N 2015/0277 (2013.01); G01N 2021/513 (2013.01); G01N 2201/061 (2013.01); G01N 2201/12 (2013.01);
Abstract

A system for determining the growth/dissolution rate of colloidal particles is disclosed and includes multiple light sources and multiple sensors. A light source is constructed to emit a beam of electromagnetic radiation at a specimen chamber that holds the colloidal particles. The chamber allows a portion of the combined beam to scatter perpendicularly or at some other angle to the combined beam. The scattered portion of the beam is directed to a sensor that detects electromagnetic radiation. The sensor is connected to processor that activates the light source and obtains an image from the sensor. Multiple images are taken at a time interval and for each image taken, and a total image intensity level is calculated and normalized. A formula is then calculated that fits the normalized values over time and a slope is determined from the formula.


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