The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Nov. 13, 2017
Applicant:

Sakura Finetek U.s.a., Inc., Torrance, CA (US);

Inventors:

Xuan S. Bui, Torrance, CA (US);

Alyicia Marie Rios, Downey, CA (US);

Erico Von Bueren, Rolling Hills Estates, CA (US);

Assignee:

Sakura Finetek U.S.A., Inc., Torrance, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05B 33/00 (2006.01); G01N 1/06 (2006.01); B26D 7/01 (2006.01); H05B 33/08 (2006.01); B26D 7/27 (2006.01);
U.S. Cl.
CPC ...
G01N 1/06 (2013.01); B26D 7/015 (2013.01); B26D 7/27 (2013.01); H05B 33/0845 (2013.01); G01N 2001/068 (2013.01);
Abstract

A microtome chuck including a mounting portion having a mating surface operable to removably attach the mounting portion to a sample sectioning device, and an electrical contact operable to electrically connect the mounting portion to a power source. The chuck further including a sample receiving portion coupled to the mounting portion, the sample receiving portion having a sample receiving surface dimensioned to receive a sample, a light source coupled to the sample receiving portion, the light source operable to emit a light from the sample receiving surface and through a sample positioned along the sample receiving surface, and circuitry electrically connecting the light source to the electrical contact of the mounting portion.


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