The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2018
Filed:
Jan. 31, 2014
Applicant:
Ventana Medical Systems, Inc., Tucson, AZ (US);
Inventors:
Karl Garsha, Sahuarita, AZ (US);
Michael Otter, Tucson, AZ (US);
Assignee:
Ventana Medical Systems, Inc., Tucson, AZ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01J 3/02 (2006.01); G01J 3/28 (2006.01); G01J 3/44 (2006.01); G01N 21/27 (2006.01); G02B 21/36 (2006.01); G01J 3/10 (2006.01); G06T 7/80 (2017.01);
U.S. Cl.
CPC ...
G01J 3/0297 (2013.01); G01J 3/10 (2013.01); G01J 3/28 (2013.01); G01J 3/2823 (2013.01); G01J 3/44 (2013.01); G01J 3/4406 (2013.01); G01N 21/274 (2013.01); G02B 21/365 (2013.01); G06K 9/0014 (2013.01); G06T 7/80 (2017.01); G01J 2003/2826 (2013.01);
Abstract
A system and method for characterization and/or calibration of performance of a multispectral imaging (MSI) system equipping the MSI system for use with a multitude of different fluorescent specimens while being independent on optical characteristics of a specified specimen and providing an integrated system level test for the MSI system. A system and method are adapted to additionally evaluate and express operational parameters performance of the MSI system in terms of standardized units and/or to determine the acceptable detection range of the MSI system.