The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2018
Filed:
Sep. 08, 2015
Centre National DE LA Recherche Scientifique-cnrs, Paris, FR;
Université Paris-sud, Orsay, FR;
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE—CNRS, Paris, FR;
Université Paris-Sud, Orsay, FR;
Abstract
According to one aspect, the invention relates to a device () for measuring the distance, with respect to a reference plane (P), from a point of light (P) of an object (O). The device comprises a two-dimensional detector () comprising a detection plane (P) and an imaging system () adapted to form an image of a light spot (P) situated on an object of interest plane () in an image plane (') arranged in the vicinity of the detection plane (P) or a conjugate plane (P′) of the detection plane. The device further comprises a separator element () for forming, from a beam emitted by a point of light of the object of interest plane (), and emerging from the imaging system () at least two coherent beams, having a spatial superposition region in which the beams interfere and a signal processing means () for determining, from the interference pattern formed on the detection plane, and resulting from the optical interferences between said coherent beams, the distance from the point of light to a conjugate plane of the detection plane in the object space of the imaging system (), said conjugate plane of the detection plane forming the reference plane (P).