The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Oct. 01, 2015
Applicant:

Xerox Corporation, Norwalk, CT (US);

Inventors:

Donald E. Thresh, Fairport, NY (US);

James D. VanBortel, Rochester, NY (US);

Michael N. Soures, Webster, NY (US);

Richard B. Gruszewski, Penfield, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/386 (2017.01); B29C 67/00 (2017.01); H04N 1/00 (2006.01); B33Y 50/02 (2015.01); B29C 64/20 (2017.01); B29C 64/40 (2017.01); B29C 64/112 (2017.01); H04N 1/03 (2006.01); H04N 1/028 (2006.01); B33Y 30/00 (2015.01); B33Y 50/00 (2015.01); G01B 11/00 (2006.01); B33Y 10/00 (2015.01);
U.S. Cl.
CPC ...
B29C 67/0088 (2013.01); B29C 64/112 (2017.08); B29C 64/20 (2017.08); B29C 64/386 (2017.08); B29C 64/40 (2017.08); B29C 67/0059 (2013.01); B29C 67/0092 (2013.01); B33Y 50/02 (2014.12); H04N 1/00827 (2013.01); H04N 1/02805 (2013.01); H04N 1/02895 (2013.01); H04N 1/03 (2013.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/00 (2014.12); G01B 11/00 (2013.01);
Abstract

A three-dimensional object printer generates image data of an object being formed in the printer with a plurality of light sources and a plurality of optical sensor arrays. A controller receives the image data and identifies measurements of the object and of the features of the object. The controller compares the measurements to expected measurements and adds material or removes material from the object in response to the identified measurements being outside a predetermined range about the expected measurements.


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