The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Jul. 31, 2017
Applicant:

Rofin-sinar Technologies Inc., Plymouth, MI (US);

Inventor:

S. Abbas Hosseini, Orlando, FL (US);

Assignee:

ROFIN SINAR TECHNOLOGIES LLC, Plymouth, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/0622 (2014.01); B23K 26/00 (2014.01); B23K 26/06 (2014.01); B23K 26/082 (2014.01); B23K 26/38 (2014.01); C03B 33/02 (2006.01); C03B 33/033 (2006.01); C03B 33/04 (2006.01); C03B 33/07 (2006.01); B23K 103/00 (2006.01); B23K 103/16 (2006.01);
U.S. Cl.
CPC ...
B23K 26/0057 (2013.01); B23K 26/0006 (2013.01); B23K 26/0624 (2015.10); B23K 26/0648 (2013.01); B23K 26/082 (2015.10); B23K 26/38 (2013.01); C03B 33/0222 (2013.01); C03B 33/033 (2013.01); C03B 33/04 (2013.01); C03B 33/07 (2013.01); B23K 2203/16 (2013.01); B23K 2203/166 (2015.10); B23K 2203/42 (2015.10); B23K 2203/50 (2015.10); B23K 2203/52 (2015.10); B23K 2203/54 (2015.10); B23K 2203/56 (2015.10);
Abstract

Systems and methods are described for forming continuous curved laser filaments in transparent materials. The filaments are preferably curved and C-shaped. Filaments may employ other curved profiles (shapes). A burst of ultrafast laser pulses is focused such that a beam waist is formed external to the material being processed without forming an external plasma channel, while a sufficient energy density is formed within an extended region within the material to support the formation of a continuous filament, without causing optical breakdown within the material. Filaments formed according to this method may exhibit lengths in the range of 100 μm-10 mm. An aberrated optical focusing element is employed to produce an external beam waist while producing distributed focusing of the incident beam within the material. Optical monitoring of the filaments may be employed to provide feedback to facilitate active control of the process.


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