The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Mar. 11, 2014
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventor:

Yasutaka Konno, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G06T 11/00 (2006.01); A61B 6/03 (2006.01); G06T 5/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A61B 6/5258 (2013.01); A61B 6/032 (2013.01); A61B 6/035 (2013.01); A61B 6/5205 (2013.01); A61B 6/586 (2013.01); G06T 5/002 (2013.01); G06T 5/005 (2013.01); G06T 7/0012 (2013.01); G06T 11/005 (2013.01); G06T 2207/10081 (2013.01);
Abstract

An image processing device or radiation imaging device for generating an image using output data from a detector for detecting a radiation transmitted through an object to be examined, wherein artifacts caused by a gap between an estimated output value and the true output value are reduced when estimating an output value of a defective element of the detector. Correction is performed not only for the output of the defective element but for the output of the surrounding normal elements used for the defective element correction by a blurring process. Additionally, whether or not to perform the blurring process for the surrounding normal elements and the degree of the blurring process are adjusted according to the device conditions, scanning conditions, and the like.


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