The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Sep. 14, 2011
Applicant:

Masayoshi Yokota, Tokyo, JP;

Inventor:

Masayoshi Yokota, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); A61B 5/107 (2006.01); A61B 1/00 (2006.01); A61B 1/045 (2006.01); A61B 1/06 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1076 (2013.01); A61B 1/00009 (2013.01); A61B 1/045 (2013.01); A61B 1/0638 (2013.01); A61B 5/1079 (2013.01); G01B 11/25 (2013.01); G01B 11/2513 (2013.01);
Abstract

Provided is an endoscope apparatus for measuring a subject. The endoscope apparatus including: an elongated insertion unit; an image capturing unit being provided on a distal end part of the insertion unit, the image capturing unit configured to obtain an image of the subject; an illumination unit comprising a first light source and configured to illuminate an observation viewing field of the image capturing unit; and a fringe projection unit comprising a second light source configured to emit a light, which differs from a light of the first light source, and a fringe pattern generation unit configured to form the fringe pattern, and configured to project the fringe pattern on the subject.


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