The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2018

Filed:

Jan. 04, 2016
Applicant:

Microvision, Inc., Redmond, WA (US);

Inventors:

Jari Honkanen, Monroe, WA (US);

Robert James Jackson, Monroe, WA (US);

P. Selvan Viswanathan, Bellevue, WA (US);

Jonathan A. Morarity, Seattle, WA (US);

David W. Armour, Kirkland, WA (US);

Assignee:

Microvision, Inc., Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 21/14 (2006.01); H04N 9/31 (2006.01);
U.S. Cl.
CPC ...
H04N 9/3185 (2013.01); G03B 21/147 (2013.01); H04N 9/315 (2013.01); H04N 9/3129 (2013.01); H04N 9/3135 (2013.01); H04N 9/3194 (2013.01);
Abstract

Briefly, in accordance with one or more embodiments, a MEMS scanned beam projector includes a light source to emit a light beam, a scanning platform to redirect the light beam impinging on the platform, and a display controller to control the light source and the scanning platform to cause the scanning platform to scan the light beam in a vertical direction and a horizontal direction in a scan pattern to project an image onto a projection surface. The display controller is configured to correct for image distortion in the projected image by providing a compensated drive signal to the scanning platform to compensate for the image distortion.


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