The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2018

Filed:

Aug. 27, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jorge D. Acuña, Vail, AZ (US);

Pankaj S. Bavishi, Pune, IN;

Dachuan Huang, Columbus, OH (US);

Rakesh Jain, San Jose, CA (US);

Ramani R. Routray, San Jose, CA (US);

Yang Song, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/24 (2006.01); H04L 12/26 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
H04L 43/08 (2013.01); H04L 67/1097 (2013.01); H04L 41/085 (2013.01);
Abstract

In one embodiment, a method includes determining a first set of similarity metrics for a first storage environment, obtaining one or more second sets of similarity metrics from second storage environments that correspond with the first storage environment, calculating a similarity measurement score between the first storage environment and each of the second storage environments, and determining a set of similar storage environments from amongst the second storage environments based on the similarity measurement scores. Other methods, systems, and computer program products are presented according to more embodiments.


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