The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2018

Filed:

Dec. 11, 2015
Applicant:

Litepoint Corporation, Sunnyvale, CA (US);

Inventors:

Christian Volf Olgaard, Saratoga, CA (US);

Ruizu Wang, San Ramon, CA (US);

Zhiyong Huang, P.R., CN;

Assignee:

LitePoint Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/29 (2015.01); H04L 12/26 (2006.01); H04B 17/00 (2015.01);
U.S. Cl.
CPC ...
H04B 17/29 (2015.01); H04B 17/0085 (2013.01); H04L 43/50 (2013.01);
Abstract

Method for testing a radio frequency (RF) data packet signal transceiver device under test (DUT) with multiple RF signal transmitters and RF signal receivers capable of concurrent operations. Multiple successions of test data packets from a tester to respective RF signal receivers of the DUT and multiple successions of responsive DUT data packets from respective RF signal transmitters of the DUT to the tester are conveyed such that multiple RF signal transmissions, multiple RF signal receptions, or RF signal transmission and reception are performed at least partially concurrently.


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