The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2018
Filed:
Dec. 15, 2015
Nec Corporation, Minato-ku, Tokyo, JP;
Kazunori Ishikawa, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
[Problem] To provide a monitoring system capable of monitoring, without stopping operations for a long period of time, a change of the characteristics of an apparatus to be subjected to characteristic measurement, to which high frequency signals are inputted. [Solution] A signal to be monitored and a reference signal are inputted to an input unit, and the input unit inputs one of the inputted signals to an apparatusto be subjected to characteristic measurement. On the basis of an output signal of the apparatusand the reference signal in the cases where the reference signal is inputted to the apparatus, an input/output characteristic calculation unitcalculates the input/output characteristics of the apparatus. On the basis of calculation results obtained from the input/output characteristic calculation unit, a correction result generating unitgenerates a correction result signal that indicates the results obtained by correcting an output signal of the apparatusin the cases where the signal to be monitored is inputted to the apparatus. On the basis of the correction result signal generated by the correction result generating unit, a failure determining unitdetermines whether the apparatus has a failure.