The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2018

Filed:

Oct. 09, 2015
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Meng Yan, Beijing, CN;

Yinwen Cao, Beijing, CN;

Zhenning Tao, Beijing, CN;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 10/00 (2013.01); H04B 10/04 (2006.01); H04B 10/079 (2013.01); H04B 10/61 (2013.01); H04L 27/00 (2006.01); H04L 27/26 (2006.01);
U.S. Cl.
CPC ...
H04B 10/0795 (2013.01); H04B 10/61 (2013.01); H04B 10/6164 (2013.01); H04L 27/0014 (2013.01); H04L 27/26 (2013.01); H04L 2027/0016 (2013.01); H04L 2027/0046 (2013.01); H04L 2027/0065 (2013.01); H04L 2027/0073 (2013.01);
Abstract

A method, apparatus and system for estimating frequency offset that includes: a first calculating unit to calculate a correlation value of each of multiple sequences with different lengths according to a received signal containing the sequences with different lengths, where each of the sequences is repeatedly transmitted many times in the signal; a second calculating unit to calculate a decimal frequency according to the correlation value; a first determining unit to determine an integer frequency offset according to the decimal frequency offset to which each of the sequences corresponds; and a second determining unit to determine a total frequency offset according to the decimal frequency offset and the integer frequency offset.


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