The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2018
Filed:
Nov. 24, 2015
Faraday Technology Corp., Hsin-Chu, TW;
Pei-Yuan Chou, Chia-yi County, TW;
Jinn-Shyan Wang, Chia-yi County, TW;
Yeong-Jar Chang, Hsin-Chu, TW;
Faraday Technology Corp., Hsin-Chu, TW;
Abstract
An apparatus for jitter measurement includes a first delay circuit, a second delay circuit, and a control circuit. The first delay circuit imposes a preliminary phase delay on an input signal to generate a delayed input signal. The second delay circuit operates with the first delay circuit to impose a fine phase delay on the delayed input signal. The control circuit controls amounts of delays imposed by the first and second delay circuits, and fine tunes the phase delay of the delayed input signal according to the amounts of delays respectively imposed by delay elements of the first and second delay circuits, and estimates or calculates a jitter window for the input signal according to adjustment results of the first and second delay circuits.