The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2018

Filed:

Jan. 10, 2014
Applicant:

Purdue Research Foundation, West Lafayette, IN (US);

Inventors:

Zheng Ouyang, West Lafayette, IN (US);

Yue Ren, West Lafayette, IN (US);

Jiangjiang Liu, West Lafayette, IN (US);

Linfan Li, West Lafayette, IN (US);

Assignee:

Purdue Research Foundation, West Lafayette, IN (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/04 (2006.01); H01J 49/16 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0409 (2013.01); H01J 49/0431 (2013.01); H01J 49/167 (2013.01); H01J 49/4205 (2013.01);
Abstract

The invention generally relates to systems for analyzing a sample and methods of use thereof. In certain aspects, the invention provides systems that include an ionization probe and a mass analyzer. The probe includes a hollow body that has a distal tip. The probe also includes a substrate that is at least partially disposed within the body and positioned prior to the distal tip so that sample extracted from the substrate flows into the body prior to exiting the distal tip. The probe also includes an electrode that operably interacts with sample extracted from the substrate.


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