The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2018
Filed:
Nov. 16, 2016
Industrial Technology Research Institute, Hsinchu, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
Measurement system and method for measuring multi-dimensions of an object are provided. A two-dimensional (2D) image capturing device captures at least one macro-2D image of the object. A three-dimensional (3D) information acquisition device acquires micro-3D measured data of the object. A integration and estimation device performs 2D and 3D image correction on macro-2D image and micro-3D measured data to map micro-3D measured data into macro-2D image to output 3D-topography data corresponding to macro-2D image of the object, and based on machine learning mechanism, performs matching procedure on at least one connection feature between any two positions in 3D-topography data with a database to elect an adapted model. Based on its corresponding to at least one fitting function, the integration and estimation device estimates the connection features of 3D-topography data to output at least one estimated feature amount, thereby obtaining measurement results corresponding to the object.