The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2018
Filed:
Sep. 29, 2017
Massachusetts Institute of Technology, Cambridge, MA (US);
Hao-yu Wu, Cambridge, MA (US);
Michael Rubinstein, Somerville, MA (US);
Eugene Inghaw Shih, Brookline, MA (US);
John V. Guttag, Lexington, MA (US);
Frederic Durand, Somerville, MA (US);
William T. Freeman, Acton, MA (US);
Neal Wadhwa, Mountain View, CA (US);
MASSACHUSETTS INSTITUTE OF TECHNOLOGY, Cambridge, MA (US);
QUANTA COMPUTER, INC., Tao Yuan Shein, TW;
Abstract
In an embodiment, a method converts two images to a transform representation in a transform domain. For each spatial position, the method examines coefficients representing a neighborhood of the spatial position that is spatially the same across each of the two images. The method calculates a first vector in the transform domain based on first coefficients representing the spatial position, the first vector representing change from a first to second image of the two images describing deformation. The method modifies the first vector to create a second vector in the transform domain representing amplified movement at the spatial position between the first and second images. The method calculates second coefficients based on the second vector of the transform domain. From the second coefficients, the method generates an output image showing motion amplified according to the second vector for each spatial position between the first and second images.