The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2018

Filed:

Apr. 07, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

David P. Woodruff, Mountain View, CA (US);

Qin Zhang, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2018.01); G06F 17/18 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01);
Abstract

Embodiments relate to methodologies and program product is provided for conducting regression analysis. In one embodiment the method includes obtaining data related to a statistical process including a plurality of points in a plurality of dimensions and organizing the plurality of points and the plurality of dimensions in a matrix. The method also includes calculating a vector of a particular measurement such that the measurement equal the number of the plurality of points and calculating a least absolute deviation by determining the number of non-zero entries provided in the matrix.


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