The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2018
Filed:
Jun. 21, 2011
Raghu Murthi, Bellevue, WA (US);
Steven Bathiche, Kirkland, WA (US);
John Allen Tardif, Sammamish, WA (US);
Nicholas Robert Baker, Cupertino, CA (US);
Raghu Murthi, Bellevue, WA (US);
Steven Bathiche, Kirkland, WA (US);
John Allen Tardif, Sammamish, WA (US);
Nicholas Robert Baker, Cupertino, CA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
A sensor manager provides dynamic input fusion using thermal imaging to identify and segment a region of interest. Thermal overlay is used to focus heterogeneous sensors on regions of interest according to optimal sensor ranges and to reduce ambiguity of objects of interest. In one implementation, a thermal imaging sensor locates a region of interest that includes an object of interest within predetermined wavelengths. Based on the thermal imaging sensor input, the regions each of the plurality of sensors are focused on and the parameters each sensor employs to capture data from a region of interest are dynamically adjusted. The thermal imaging sensor input may be used during data pre-processing to dynamically eliminate or reduce unnecessary data and to dynamically focus data processing on sensor input corresponding to a region of interest.