The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2018
Filed:
Sep. 19, 2017
Nuctech Company Limited, Beijing, CN;
Chunguang Zong, Beijing, CN;
Ying Li, Beijing, CN;
Hejun Zhou, Beijing, CN;
Jianmin Li, Beijing, CN;
Yuanjing Li, Beijing, CN;
Yulan Li, Beijing, CN;
Li Zhang, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
Abstract
A ray inspection system used to be mounted in a container yard to inspect an object within a container is provided. The ray inspection system includes: a ray generator device configured to emit a ray, a ray receiving device configured to receive the ray, and at least one chamber for receiving the ray generator device and the ray receiving device therein. Each of the at least one chamber is configured to be a standard container or a chamber which has a same shape, a same size and a same structure as a standard container such that the ray inspection system is adapted to be stacked in the container yard.