The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2018
Filed:
Aug. 04, 2015
University of Seoul Industry Cooperation Foundation, Seoul, KR;
Hyung Sup Jung, Seoul, KR;
Min-Jeong Jo, Seoul, KR;
Abstract
An apparatus and method for stacking multi-temporal MAI interferograms Disclosed are disclosed herein. The apparatus includes a processor configured to: generate a forward-looking InSAR (Interferometric Synthetic Aperture Radar) interferogram and a backward-looking InSAR interferogram of multi-temporal interferometric pairs; generate a residual forward-looking interferogram and a residual backward-looking interferogram by removing low-frequency phase components from the forward-looking InSAR interferogram and the backward-looking InSAR interferogram; generate a stacked forward-looking interferogram and a stacked backward-looking interferogram by separately stacking the residual forward-looking interferogram and the residual backward-looking interferogram; and generate a stacked MAI interferogram based on a phase difference between the stacked forward-looking interferogram and the stacked backward-looking interferogram.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile