The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10006974 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 26, 2018

Filed:

Sep. 21, 2016
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

John C. Difonzo, Emerald Hills, CA (US);

Maurizio Bertoldo, Oleggio, IT;

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B03C 1/00 (2006.01); G01R 33/12 (2006.01); G01R 33/038 (2006.01);
U.S. Cl.
CPC ...
G01R 33/12 (2013.01); G01R 33/0385 (2013.01);
Abstract

An automated magnet quality measurement system includes a magnet measuring component and an automated magnet moving component. The magnet measuring component can be configured to measure EMF for a plurality of magnets. The automated magnet moving component can move each of the plurality of magnets into and out of the magnet measuring component without requiring any manual intervention, with only one of the plurality of magnets being within the magnet measuring component at a given time. The magnet measuring component can be a Helmholtz coil and the automated magnet moving component can be a rotating disk. The overall system can also include a loading system configured to load each of the magnets onto the automated magnet moving component on an individual and sequential basis, and a sorting system configured to sort the magnets based upon their EMF measurements.


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