The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2018

Filed:

Aug. 21, 2015
Applicant:

University of Washington, Seattle, WA (US);

Inventors:

Nathan J. Sniadecki, Seattle, WA (US);

Lucas Ting, Seattle, WA (US);

Assignee:

University of Washington, Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M 1/42 (2006.01); G01N 33/49 (2006.01); G01N 33/53 (2006.01); C12M 1/34 (2006.01); G01N 15/14 (2006.01); G01N 15/10 (2006.01); C12M 1/00 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/4905 (2013.01); C12M 23/20 (2013.01); C12M 23/26 (2013.01); C12M 29/00 (2013.01); C12M 35/04 (2013.01); C12M 41/46 (2013.01); G01N 15/1056 (2013.01); G01N 15/1459 (2013.01); G01N 15/1463 (2013.01); G01N 33/5302 (2013.01); B01L 3/502746 (2013.01); G01N 15/1404 (2013.01); G01N 2015/1006 (2013.01);
Abstract

The present technology relates generally to devices to expose cells to fluid shear forces and associated systems and methods. In particular, several embodiments are directed toward devices to expose cells to fluid shear forces in order to measure changes in internal cell forces. In some embodiments, a fluidic device includes a flow unit configured to induce fluid flow through the device. The device further includes a fluid channel configured to accept a biological sample dispersed on an array of flexible structures. The flow unit can be configured to induce disturbed and/or laminar flow in the fluid channel. The device can further include optical or magnetic detection means configured to measure a degree of deflection of one or more flexible structures in the array.


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