The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2018
Filed:
Nov. 23, 2010
James Mitchell Wells, Lafayette, IN (US);
Mark Gregory, Lafayette, IN (US);
Matt Briscoe, Zionsville, IN (US);
James Mitchell Wells, Lafayette, IN (US);
Mark Gregory, Lafayette, IN (US);
Matt Briscoe, Zionsville, IN (US);
FLIR Detection, Inc., Stillwater, OK (US);
Abstract
Analytical instruments are provided that can include a sample inlet component with the sample inlet component including a first sampling port; a plurality of sample capturing assemblies; and a first valve assembly in fluid communication with both the sampling port and the sample capturing assemblies. The instrument can further include a sample analysis component in fluid communication with the first valve assembly of the sample inlet component; and an instrument control component in controlling communication with both the sample inlet component and the analysis component. Instrumental analysis methods are provided that can include continuously providing sample to at least one of a plurality of sample capturing assemblies; and selectively analyzing the contents of at least one of the plurality of sample capturing assemblies.