The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2018
Filed:
Aug. 10, 2015
Method and apparatus for determining curie temperature distribution of a sample of magnetic material
Seagate Technology Llc, Cupertino, CA (US);
Ganping Ju, Pleasanton, CA (US);
Jason L Presseky, Menlo Park, CA (US);
Roy W. Chantrell, Anglesey, GB;
Xiaowei Wu, Pleasanton, CA (US);
Xi Chen, Fremont, CA (US);
Xiaobin Zhu, San Ramon, CA (US);
Yingguo Peng, San Ramon, CA (US);
Seagate Technology LLC, Cupertino, CA (US);
Abstract
Determining a Curie temperature (Tc) distribution of a sample comprising magnetic material involves subjecting the sample to an electromagnetic field, heating the sample over a range of temperatures, generating a signal representative of a parameter of the sample that changes as a function of changing sample temperature while the sample is subjected to the electromagnetic field, and determining the Tc distribution of the sample using the generated signal and a multiplicity of predetermined parameters of the sample.